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| Title |
TECH STOCK VALUATION |
| Author |
MARK HIRSCHEY |
| Publication
Date |
18/09/2003 |
| Description |
Extends the R&D literature. Scientific measures of patent quality give tech stock investors and R&D managers a tool that can be used to measure R&D program effectiveness. At the same time, it gives investors a tool to help them assess the value of hard-to |
| ISBN |
123497043 |
| Publisher |
ELSEVIER |
| Book Type |
Hardback |
| . |
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| Other
Titles |
ADVANCED FINANCIAL ACCOUNTING - RICHARD LEWIS, DAVID PENDRILL, DAVID S. SIMON |
| |
PAYROLL ACCOUNTING WORKBOOK - MICHAEL FARDON |
RETURN TO TAX WORLD
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